The JPK Atomic Force Microscope can be used for a multitude of applications, including force probing, micro-rheology and material characterization. Two Scanning Probe Microscopy (SPM) heads available combined with widefield (TL, RL and fluorescence) microscopy. The system has mutliple modalities for contact, tapping and QI (quantitative Imaging) modes, as well as Multi-position probing.
Description
Location: I24.U1.031 (Moonstone Building)
SCAN HEADS:
JPK (Bruker) Cellhesion 200: Force spectroscopy with two different Z piezo actuators (15μm or 100μm). Multiposition probing based on motorized stage (1μm resolution in X and Y).
JPK (Bruker) Nanowizard 4: AFM scanning head suitable for contact, tapping and QI (quantitative Imaging) modes. Up to 100μm x 100μm scan area.
MICROSCOPE:
Hybrid microscope setup with upright and inverted modes available:
- Olympus IX 71 inverted fluorescence microscope:
- 2x, 10x, 20x, 40x and 60x objectives.
- GFP and mCherry filter cubes.
- Andor iXon EMCCD camera (512×512 pixels) for fluorescence.
- Color camera available for TL and phase contrast modes.
2. In-house developed top-view optics (2x) microscope:
- Reflected light mode available for material science applications (alignment marks, etc.)
- 2x magnification.
- Color camera.
Accessories:
- Petri dish heater unit
- Available flow injection module
System manual and additional material is available on SeaFile (login required).
Additional information
| Building | i24 |
|---|---|
| Camera / Detector | Color CMOS, EMCCD |
| Fluorescent Lightsource | LED: 470-475nm, LED: 545-555nm |
| System_Specification | Illumination: Fluorescence, Illumination: Bightfield, Incubation: heating stage |
| Technology / Application | AFM, Time-lapse recording, Multi-position, Material topology, Surface Topography |
