Author: Gabriel Krens

Demo: Leica STELLARIS, Nano Workflow (CLEM) & Thunder-3D workshop, 18-21 October, 2021

Posted onAuthorGabriel Krens

Leica Microsystems, in cooperation with the Institute of Science and Technology Austria (IST Austria), are pleased to invite you to attend talks and product showcases featuring the STELLARIS Confocal Microscope Platform, THUNDER Imagers widefield systems and the Leica Nano Workflow for live cell CLEM. Join us and learn how these microscopy innovations can make a difference to your research. Monday 18th – Tuesday 19th October, LIVE PRESENTATIONS Monday, 18th October14:00-15:30Capture Life the moment it happens – the Leica Nano Workflow for live cell CLEMwith Dr Thorben Kurz Tuesday, 19th October09:00-10:25Leica THUNDER Imaging Systems: Analyzing 3D specimens with widefield microscopywith Dr Jan Read More …

2021-07-19: BIF COVID-19 guidelines update

Posted onAuthorGabriel Krens

The 3G rule remains the benchmark for many access and meeting regulations. Even if you have been fully vaccinated, continue to get tested and to wear a mask. While the risk of catching or of transmitting an infection is significantly lower once vaccinated it cannot be ruled out completely.  The current guidelines implemented in the Bioimaging Facility Keep a physical distance >1 meter (also when working together at a system) → 1meter is more than 1 arm-length… Wear (FFP2) masks Disinfect common contact points and workspace before and after use (microscopy, cytometer, analysis workstation)! Please provide a negative COVID-19 test before Read More …

DEMO: Nikon SIM-TIRF, October 4th-20th 2021

Posted onAuthorGabriel Krens

The Bioimaging Facility at IST Austria is hosting a demonstration of a Nikon N-SIM system from October 4th – 20th, 2021. The N-SIM S Super Resolution Microscope is a unique high-speed structured illumination system that achieves acquisition speeds of up to 15 fps, enabling fast biological processes to be captured at twice the spatial resolution of conventional light microscopes (up to 115nm in XY). Combining the N-SIM S and a confocal microscope gives you the flexibility to select a location in the confocal image and switch to super-resolution to view the desired part of the location in minute detail. (source) Read More …